Hitachi Travelstar Z5K320, 320GB aangeboden

Gebruikte HDD.

SMART:
=== START OF INFORMATION SECTION ===
Model Family: Hitachi/HGST Travelstar Z5K320
Device Model: Hitachi HTS543232A7A384
Serial Number: 110607E2N31243KHLKRK
LU WWN Device Id: 5 000cca 615f15dcb
Firmware Version: ES2OA70K
User Capacity: 320,072,933,376 bytes [320 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: 5400 rpm
Form Factor: 2.5 inches
Device is: In smartctl database 7.3/6157
ATA Version is: ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 2.6, 3.0 Gb/s
Local Time is: Thu Jul 23 17:37:01 2026 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 45) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 114) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 062 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 214 214 033 Pre-fail Always - 1
4 Start_Stop_Count 0x0012 099 099 000 Old_age Always - 2626
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 095 095 000 Old_age Always - 2486
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 2626
191 G-Sense_Error_Rate 0x000a 098 098 000 Old_age Always - 262144
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 7
193 Load_Cycle_Count 0x0012 090 090 000 Old_age Always - 101772
194 Temperature_Celsius 0x0002 193 193 000 Old_age Always - 31 (Min/Max 11/44)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 2
223 Load_Retry_Count 0x000a 100 100 000 Old_age Always - 0

SMART Error Log Version: 1
ATA Error Count: 2
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 2 occurred at disk power-on lifetime: 1901 hours (79 days + 5 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 10 48 0c 75 05 Error: ICRC, ABRT at LBA = 0x05750c48 = 91556936

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 10 c8 48 0c 75 40 00 03:07:38.939 WRITE FPDMA QUEUED
61 18 c0 28 0c 75 40 00 03:07:38.939 WRITE FPDMA QUEUED
61 10 b8 10 0c 75 40 00 03:07:38.939 WRITE FPDMA QUEUED
61 10 b0 f8 0b 75 40 00 03:07:38.939 WRITE FPDMA QUEUED
61 10 a8 e0 0b 75 40 00 03:07:38.938 WRITE FPDMA QUEUED

Error 1 occurred at disk power-on lifetime: 1901 hours (79 days + 5 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 57 0c 75 05 Error: ICRC, ABRT at LBA = 0x05750c57 = 91556951

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 10 c8 48 0c 75 40 00 03:07:38.939 WRITE FPDMA QUEUED
61 18 c0 28 0c 75 40 00 03:07:38.939 WRITE FPDMA QUEUED
61 10 b8 10 0c 75 40 00 03:07:38.939 WRITE FPDMA QUEUED
61 10 b0 f8 0b 75 40 00 03:07:38.939 WRITE FPDMA QUEUED
61 10 a8 e0 0b 75 40 00 03:07:38.938 WRITE FPDMA QUEUED

SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 2486 -
# 2 Short offline Completed without error 00% 2486 -

SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

The above only provides legacy SMART information - try 'smartctl -x' for more