Toshiba MQ01ABF050M, 500GB aangeboden

Schijfje wat een tijd heeft stil gestaan

Smart test:

root@truenas[~]# smartctl -a /dev/sdl
smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.6.44-production+truenas] (local build)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Family: Toshiba 2.5" HDD MQ01ABF...
Device Model: TOSHIBA MQ01ABF050
Serial Number: 93KCSQMES
LU WWN Device Id: 5 000039 505b88189
Firmware Version: AM003M
User Capacity: 500,107,862,016 bytes [500 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: 5400 rpm
Form Factor: 2.5 inches
Device is: In smartctl database 7.3/6157
ATA Version is: ATA8-ACS (minor revision not indicated)
SATA Version is: SATA 2.6, 3.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Tue Jul 7 21:24:34 2026 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 116) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 1302
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 437
5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 253
10 Spin_Retry_Count 0x0033 108 100 030 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 403
191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 25
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 48
193 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 1551
194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 31 (Min/Max 19/50)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
220 Disk_Shift 0x0002 100 100 000 Old_age Always - 0
222 Loaded_Hours 0x0032 100 100 000 Old_age Always - 247
223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 0
224 Load_Friction 0x0022 100 100 000 Old_age Always - 0
226 Load-in_Time 0x0026 100 100 000 Old_age Always - 270
240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline - 0

SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 1 occurred at disk power-on lifetime: 249 hours (10 days + 9 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 41 88 df 6b 60 40 Error: ICRC, ABRT at LBA = 0x00606bdf = 6319071

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 08 80 f8 87 60 40 00 00:06:02.116 WRITE FPDMA QUEUED
61 f8 78 00 87 60 40 00 00:06:02.116 WRITE FPDMA QUEUED
61 f8 70 08 86 60 40 00 00:06:02.115 WRITE FPDMA QUEUED
61 f8 68 10 85 60 40 00 00:06:02.115 WRITE FPDMA QUEUED
61 f8 60 18 84 60 40 00 00:06:02.115 WRITE FPDMA QUEUED

SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 253 -

SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

The above only provides legacy SMART information - try 'smartctl -x' for more