Toshiba MK3265GSX, 320GB aangeboden

=== START OF INFORMATION SECTION ===
Model Family: Toshiba 2.5" HDD MK..65GSX
Device Model: TOSHIBA MK3265GSX
Serial Number: 41PJCHZ1T
LU WWN Device Id: 5 000039 333c0798b
Firmware Version: GJ002J
User Capacity: 320,072,933,376 bytes [320 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: 5400 rpm
Form Factor: 2.5 inches
Device is: In smartctl database 7.5/6028
ATA Version is: ATA8-ACS (minor revision not indicated)
SATA Version is: SATA 2.6, 3.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Thu Jun 25 16:41:00 2026 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 128 (minimum power consumption without standby)
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 96) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate PO-R-- 100 100 050 - 0
2 Throughput_Performance P-S--- 100 100 050 - 0
3 Spin_Up_Time POS--K 100 100 001 - 1280
4 Start_Stop_Count -O--CK 100 100 000 - 1005
5 Reallocated_Sector_Ct PO--CK 100 100 050 - 0
7 Seek_Error_Rate PO-R-- 100 100 050 - 0
8 Seek_Time_Performance P-S--- 100 100 050 - 0
9 Power_On_Hours -O--CK 096 096 000 - 1611
10 Spin_Retry_Count PO--CK 120 100 030 - 0
12 Power_Cycle_Count -O--CK 100 100 000 - 831
191 G-Sense_Error_Rate -O--CK 100 100 000 - 12
192 Power-Off_Retract_Count -O--CK 100 100 000 - 25
193 Load_Cycle_Count -O--CK 089 089 000 - 111043
194 Temperature_Celsius -O---K 100 100 000 - 33 (Min/Max 15/47)
196 Reallocated_Event_Count -O--CK 100 100 000 - 0
197 Current_Pending_Sector -O--CK 100 100 000 - 0
198 Offline_Uncorrectable ----CK 100 100 000 - 0
199 UDMA_CRC_Error_Count -O--CK 200 200 000 - 0
220 Disk_Shift -O---- 100 100 000 - 8
222 Loaded_Hours -O--CK 098 098 000 - 1061
223 Load_Retry_Count -O--CK 100 100 000 - 0
224 Load_Friction -O---K 100 100 000 - 0
226 Load-in_Time -OS--K 100 100 000 - 225
240 Head_Flying_Hours P----- 100 100 001 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning

General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 64 Ext. Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer

SMART Extended Comprehensive Error Log Version: 1 (64 sectors)
No Errors Logged

SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 0 -
# 2 Short offline Completed without error 00% 0 -

SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

SCT Status Version: 2
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 33 Celsius
Power Cycle Min/Max Temperature: 32/33 Celsius
Lifetime Min/Max Temperature: 15/47 Celsius
Under/Over Temperature Limit Count: 0/0

SCT Error Recovery Control:
Read: Disabled
Write: Disabled

Device Statistics (GP/SMART Log 0x04) not supported

Pending Defects log (GP Log 0x0c) not supported

SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x0002 4 0 R_ERR response for data FIS
0x0003 4 0 R_ERR response for device-to-host data FIS
0x0004 4 0 R_ERR response for host-to-device data FIS
0x0005 4 0 R_ERR response for non-data FIS
0x0006 4 0 R_ERR response for device-to-host non-data FIS
0x0007 4 0 R_ERR response for host-to-device non-data FIS
0x0008 4 0 Device-to-host non-data FIS retries
0x0009 4 1 Transition from drive PhyRdy to drive PhyNRdy
0x000a 4 0 Device-to-host register FISes sent due to a COMRESET
0x000b 4 0 CRC errors within host-to-device FIS
0x000d 4 0 Non-CRC errors within host-to-device FIS
0x000f 4 0 R_ERR response for host-to-device data FIS, CRC
0x0010 4 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 4 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 4 0 R_ERR response for host-to-device non-data FIS, non-CRC