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smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.8.0-110-generic] (local build)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 850 EVO 120GB
LU WWN Device Id: 5 002538 da002517b
Firmware Version: EMT01B6Q
User Capacity: 120,034,123,776 bytes [120 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database 7.3/5528
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Fri May 8 11:43:35 2026 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 64) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0
9 Power_On_Hours 0x0032 093 093 000 Old_age Always - 34288
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 105
177 Wear_Leveling_Count 0x0013 078 078 000 Pre-fail Always - 460
179 Used_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 0
181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0
182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0
183 Runtime_Bad_Block 0x0013 100 099 010 Pre-fail Always - 0
187 Uncorrectable_Error_Cnt 0x0032 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0032 071 046 000 Old_age Always - 29
195 ECC_Error_Rate 0x001a 200 200 000 Old_age Always - 0
199 CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0
235 POR_Recovery_Count 0x0012 099 099 000 Old_age Always - 49
241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 67470906728
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
The above only provides legacy SMART information - try 'smartctl -x' for more
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: Samsung SSD 850 EVO 120GB
LU WWN Device Id: 5 002538 da002517b
Firmware Version: EMT01B6Q
User Capacity: 120,034,123,776 bytes [120 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available
Device is: In smartctl database 7.3/5528
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Fri May 8 11:43:35 2026 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 64) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0
9 Power_On_Hours 0x0032 093 093 000 Old_age Always - 34288
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 105
177 Wear_Leveling_Count 0x0013 078 078 000 Pre-fail Always - 460
179 Used_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 0
181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0
182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0
183 Runtime_Bad_Block 0x0013 100 099 010 Pre-fail Always - 0
187 Uncorrectable_Error_Cnt 0x0032 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0032 071 046 000 Old_age Always - 29
195 ECC_Error_Rate 0x001a 200 200 000 Old_age Always - 0
199 CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0
235 POR_Recovery_Count 0x0012 099 099 000 Old_age Always - 49
241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 67470906728
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
The above only provides legacy SMART information - try 'smartctl -x' for more
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