Samsung 840 Pro 128GB aangeboden

smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.8.0-110-generic] (local build)
Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG SSD SM841N 2.5 7mm 128GB
LU WWN Device Id: 5 002538 500000000
Firmware Version: DXM03D0Q
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
TRIM Command: Available, deterministic, zeroed
Device is: In smartctl database 7.3/5528
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Wed Apr 15 09:42:09 2026 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 240) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 15) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.

SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 098 098 000 Old_age Always - 1124
175 Program_Fail_Count_Chip 0x0032 100 100 010 Old_age Always - 0
176 Erase_Fail_Count_Chip 0x0032 100 100 010 Old_age Always - 0
177 Wear_Leveling_Count 0x0013 067 067 005 Pre-fail Always - 1193
178 Used_Rsvd_Blk_Cnt_Chip 0x0013 100 100 010 Pre-fail Always - 0
179 Used_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 0
180 Unused_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 4576
181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0
182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0
187 Uncorrectable_Error_Cnt 0x0032 100 100 000 Old_age Always - 0
195 ECC_Error_Rate 0x001a 200 200 000 Old_age Always - 0
241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 31683150588
242 Total_LBAs_Read 0x0032 099 099 000 Old_age Always - 12925816610

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]

SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.