WD Red Plus, 6TB (64MB cache, WD60EFRX) aangeboden

Let op Het is niet aan te raden deze schijf te gebruiken voor belangrijke data, zie onderstaande SMART Data.

Geschikt voor onderdelen voor Data Recovery of wanneer je het risico wil nemen dat je de data op deze schijf kwijt bent.

Kosten en risico van verzending voor rekening koper.

Onderstaande SMART Data is via een USB Dock gemaakt.

[code]
smartctl 7.5 2025-04-30 r5714 [x86_64-linux-6.17.7-ba25.fc43.x86_64] (local build)
Copyright (C) 2002-25, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Family: Western Digital Red Plus
Device Model: WDC WD60EFRX-68L0BN1
Serial Number: WD-WX11D86J1EAL
LU WWN Device Id: 5 0014ee 2633a4be1
Firmware Version: 82.00A82
User Capacity: 6,001,175,126,016 bytes [6.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5700 rpm
Device is: In smartctl database 7.5/5852
ATA Version is: ACS-2, ACS-3 T13/2161-D revision 3b
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 1.5 Gb/s)
Local Time is: Tue Feb 24 08:54:05 2026 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, NOT FROZEN [SEC1]

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 3344) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 687) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x303d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate POSR-K 177 171 051 - 1021
3 Spin_Up_Time POS--K 203 196 021 - 8850
4 Start_Stop_Count -O--CK 097 097 000 - 3202
5 Reallocated_Sector_Ct PO--CK 200 200 140 - 0
7 Seek_Error_Rate -OSR-K 200 200 000 - 0
9 Power_On_Hours -O--CK 030 030 000 - 51394
10 Spin_Retry_Count -O--CK 100 100 000 - 0
11 Calibration_Retry_Count -O--CK 100 100 000 - 0
12 Power_Cycle_Count -O--CK 099 099 000 - 1312
192 Power-Off_Retract_Count -O--CK 200 200 000 - 90
193 Load_Cycle_Count -O--CK 198 198 000 - 8076
194 Temperature_Celsius -O---K 115 101 000 - 37
196 Reallocated_Event_Count -O--CK 200 200 000 - 0
197 Current_Pending_Sector -O--CK 200 200 000 - 0
198 Offline_Uncorrectable ----CK 100 253 000 - 0
199 UDMA_CRC_Error_Count -O--CK 200 200 000 - 0
200 Multi_Zone_Error_Rate ---R-- 200 200 000 - 1
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning

ATA_READ_LOG_EXT (addr=0x00:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented [JMicron]
Read GP Log Directory failed

SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 5 Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x09 SL R/W 1 Selective self-test log
0x30 SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f SL R/W 16 Host vendor specific log
0xa0-0xa7 SL VS 16 Device vendor specific log
0xa8-0xb6 SL VS 1 Device vendor specific log
0xb7 SL VS 54 Device vendor specific log
0xbd SL VS 1 Device vendor specific log
0xc0 SL VS 1 Device vendor specific log
0xe0 SL R/W 1 SCT Command/Status
0xe1 SL R/W 1 SCT Data Transfer

SMART Extended Comprehensive Error Log (GP Log 0x03) not supported

SMART Error Log Version: 1
No Errors Logged

SMART Extended Self-test Log (GP Log 0x07) not supported

SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed: read failure 90% 51337 49376126
# 2 Extended offline Completed: read failure 90% 51312 49376120
# 3 Short offline Completed: read failure 90% 51280 202453464
# 4 Short offline Completed without error 00% 43998 -
# 5 Short offline Completed without error 00% 43326 -
# 6 Short offline Completed without error 00% 42583 -
# 7 Short offline Completed without error 00% 41840 -
# 8 Short offline Completed without error 00% 41121 -
# 9 Short offline Completed without error 00% 40376 -
#10 Short offline Completed without error 00% 39657 -
#11 Short offline Completed without error 00% 38914 -
#12 Short offline Completed without error 00% 38173 -
#13 Short offline Completed without error 00% 37454 -
#14 Short offline Completed without error 00% 36711 -
#15 Short offline Completed without error 00% 35997 -
#16 Short offline Completed without error 00% 35255 -
#17 Short offline Completed without error 00% 34560 -
#18 Short offline Completed without error 00% 33816 -
#19 Short offline Completed without error 00% 33073 -
#20 Short offline Completed without error 00% 32354 -
#21 Short offline Completed without error 00% 31610 -

SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

SCT Status Version: 3
SCT Version (vendor specific): 258 (0x0102)
Device State: Active (0)
Current Temperature: 38 Celsius
Power Cycle Min/Max Temperature: 38/39 Celsius
Lifetime Min/Max Temperature: 5/51 Celsius
Under/Over Temperature Limit Count: 0/0
Vendor specific:
01 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00
00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00

SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 0/60 Celsius
Min/Max Temperature Limit: -41/85 Celsius
Temperature History Size (Index): 478 (174)

Index Estimated Time Temperature Celsius
175 2026-02-24 00:57 40 *********************
176 2026-02-24 00:58 ? -
177 2026-02-24 00:59 40 *********************
178 2026-02-24 01:00 39 ********************
179 2026-02-24 01:01 39 ********************
180 2026-02-24 01:02 ? -
181 2026-02-24 01:03 39 ********************
182 2026-02-24 01:04 38 *******************
183 2026-02-24 01:05 38 *******************
184 2026-02-24 01:06 38 *******************
185 2026-02-24 01:07 42 ***********************
... ..(457 skipped). .. ***********************
165 2026-02-24 08:45 42 ***********************
166 2026-02-24 08:46 ? -
167 2026-02-24 08:47 40 *********************
... ..( 6 skipped). .. *********************
174 2026-02-24 08:54 40 *********************

Write SCT (Get) Error Recovery Control Command failed: Read of ATA output registers not implemented [JMicron]
SCT (Get) Error Recovery Control command failed

Device Statistics (GP/SMART Log 0x04) not supported

Pending Defects log (GP Log 0x0c) not supported

ATA_READ_LOG_EXT (addr=0x11:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented [JMicron]
Read SATA Phy Event Counters failed
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